Optical patterned wafer inspection equipment is a device which is used to detect the highly sensitive defect of wafer sheet with the help of optical system in the manufacturing of miniature semiconductors.

The global Optical Patterned Wafer Inspection Equipment (OPWIE) market was valued at xx million US$ in 2018 and will reach xx million US$ by the end of 2025, growing at a CAGR of xx% during 2019-2025.
This report focuses on Optical Patterned Wafer Inspection Equipment (OPWIE) volume and value at global level, regional level and company level. From a global perspective, this report represents overall Optical Patterned Wafer Inspection Equipment (OPWIE) market size by analyzing historical data and future prospect.
Regionally, this report categorizes the production, apparent consumption, export and import of Optical Patterned Wafer Inspection Equipment (OPWIE) in North America, Europe, China, Japan, Southeast Asia and India.
For each manufacturer covered, this report analyzes their Optical Patterned Wafer Inspection Equipment (OPWIE) manufacturing sites, capacity, production, ex-factory price, revenue and market share in global market.

The following manufacturers are covered:
Hermes Microvision
KLA-Tencor
Applied Materials
Hitachi High-Technologies
ASML
Tokyo Seimitsu
Toray Engineering
JEOL
Tokyo Seimitsu

Segment by Regions
North America
Europe
China
Japan
Southeast Asia
India

Segment by Type
Bright field inspection
Dark field inspection

Segment by Application
Consumer electronics
Automation